Santec Tunable Laser TSL-775

Santec TSL-775 is a high-power, wide-tuning-range tunable laser designed for optical communication testing, optical sensing, photonic integrated circuit (PIC) characterization, and cutting-edge scientific research. As a representative of Santec's high-end tunable laser series, TSL-775 excels in output power, wavelength accuracy, and tuning speed, and is suitable for applications with stringent requirements on light source performance.

1. Karatteristiċi ewlenin u vantaġġi tekniċi

(1) Firxa wiesgħa ta 'rfinar ta' wavelength

Wavelength range: 1480–1640 nm (covering C-band and L-band), compatible with mainstream fiber optic communication windows.

Tuning resolution: 0.1 pm (picometer level), supporting high-precision wavelength scanning.

(2) High output power

Maximum output power: 80 mW (typical), meeting the needs of long-distance fiber testing and high-loss device characterization.

Power stability: ±0.02 dB (short term), ensuring test data reliability.

(3) High-speed wavelength tuning

Tuning speed: up to 200 nm/s, suitable for fast scanning applications (such as spectral analysis, OCT).

Wavelength repeatability: ±1 pm, ensuring consistency of multiple scans.

(4) Low noise and narrow linewidth

Spectral linewidth: <100 kHz (coherent communication level), extremely low phase noise.

Relative intensity noise (RIN): <-150 dB/Hz, suitable for high-sensitivity detection.

(5) Flexible modulation and control

Direct modulation bandwidth: DC–100 MHz, supporting analog/digital modulation.

Interface: GPIB, USB, LAN, compatible with automated test systems.

2. Żoni ta 'applikazzjoni tipiċi

(1) Optical communication testing

DWDM system verification: simulate multi-wavelength channels, test optical modules and ROADM performance.

Silicon optical device characterization: measure the wavelength-dependent response of modulators and waveguides.

(2) Sensing ottiku

FBG (Fiber Bragg Grating) demodulation: high-precision detection of wavelength shift caused by temperature/strain.

Distributed fiber sensing (DAS/DTS): provides high-power, stable light source.

(3) Photonic integrated circuit (PIC) testing

Silicon photonic chip debugging: fast wavelength scanning, evaluation of device insertion loss, crosstalk and other parameters.

Adjustable laser source integration: used for wavelength-related performance verification of PIC.

(4) Scientific research experiments

Quantum optics: generation of entangled photon pairs, quantum key distribution (QKD).

Nonlinear optics research: stimulated Brillouin scattering (SBS), four-wave mixing (FWM).

3. Technical Parameters (Typical Values)

Parameters TSL-775 Specifications

Wavelength range 1480–1640 nm (C/L band)

Output power 80 mW (maximum)

Wavelength accuracy ±1 pm (built-in wavelength meter calibration)

Tuning speed Up to 200 nm/s

Spectral linewidth <100 kHz

Power stability ±0.02 dB (short term)

Modulation bandwidth DC–100 MHz

Interfaces GPIB, USB, LAN

4. Comparison with competitors (TSL-775 vs. other tunable lasers)

Features TSL-775 (Santec) Keysight 81600B Yenista T100S-HP

Wavelength range 1480–1640 nm 1460–1640 nm 1500–1630 nm

Output power 80 mW 10 mW 50 mW

Tuning speed 200 nm/s 100 nm/s 50 nm/s

Preċiżjoni tal-wavelength ±1 pm ±5 pm ±2 pm

Applicable scenarios High-speed test/PIC characterization General communication test High-power sensing

5. Sommarju tal-vantaġġi ewlenin

High power output (80 mW) - suitable for long-distance or high-loss test scenarios.

Ultrafast tuning (200 nm/s) - improves test efficiency and adapts to dynamic scanning requirements.

Picometer-level wavelength accuracy - meets the precision test requirements of photonic integrated circuits (PICs).

Low noise and narrow linewidth - provides pure light source for coherent communication and quantum experiments.

Utenti tipiċi:

Optical communication equipment manufacturers (such as Huawei and Cisco)

Photonic chip R&D laboratories (such as Intel Silicon Photonics Team)

National scientific research institutions (quantum technology, optical sensing)